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dual - axis 5 g acceleromete r with spi interface data sheet adis16006 rev. c document feedback information furnished by analog devices is believed to be accurate and reliable. however, no responsibility is assumed by analog devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. specif ications subject to change without notice. no license is granted by implication or otherwise under any patent or patent rights of analog devices. trademarks and registered trademarks are the property of their respective owners. one technology way, p.o. box 9106, norwood, ma 02062 - 9106, u.s.a. tel: 781.329.4700 ? 2006 C 2013 analog devices, inc. all rights reserved. technical support www.analog.com features dual - axis accelerometer spi digital output interface internal temperature sensor highly integrated; minimal external components b andwidth externally selectable 1.9 m g resolution at 60 hz externally controlled electrostatic self - test 3.0 v to 5.2 5 v single - supply operation low power: <2 ma 3500 g shock survival 7.2 mm 7.2 mm 3. 7 mm package applications industrial vibration/motion sensing platform stabilization dual - axis tilt sensing tracking, recording, analysis devices alarms and security de vices general description the adis16006 is a low cost, low power, complete dual - axis accelerometer with an integrated serial peripheral interface (spi). an integrated temperature sensor is also available on the spi interface. the adis16006 measures acceleration with a full - scale range of 5 g (minimum). the adis16006 can measure both dynamic acceleration (vibratio n) and static acceleration (gravity). the typical noise floor is 200 g /hz, allowing signals below 1.9 m g (60 hz bandwidth) to be resolved. the bandwidth of the accelerometer is set with optional capacitors, c x and c y , at the xfilt pin and the yfilt pin . digital output data for both axes is available via the serial interface. an externally driven self - test pin (st) allows the user to verify the accelerometer functionality. the adis16006 is available in a 7. 2 mm 7.2 mm 3.7 mm, 12- terminal lga package. functional block dia gram sclk din dout cs tcs temp sensor serial interface dual-axis 5 g accelerometer v cc c dc com st c y c x yfilt xfilt adis16006 05975-001 figure 1.
adis16006 data sheet rev. c | page 2 of 16 table of contents features .............................................................................................. 1 applications ....................................................................................... 1 general description ......................................................................... 1 functional block diagram .............................................................. 1 revision history ............................................................................... 2 specifications ..................................................................................... 3 timing specifications .................................................................. 4 circuit and timing diagrams ..................................................... 5 absolute maximum ratings ............................................................ 6 esd caution .................................................................................. 6 pin configuration and function descriptions ............................. 7 typical performance characteristics ............................................. 8 theory of operation ...................................................................... 11 accelerometer data format ...................................................... 11 self - te st ....................................................................................... 11 serial interface ............................................................................ 11 accelerometer serial interface .................................................. 11 temperature sensor serial interface ........................................ 12 power supply decoupling ......................................................... 12 setting the bandwidth ............................................................... 13 selecting filter characteristics: the noise/ bandwidth trade - off ................................................................................................. 13 applications ..................................................................................... 15 second level assembly .............................................................. 15 outline dimensions ....................................................................... 16 ordering guide .......................................................................... 16 revision history 2/13 rev. b to rev. c changes to figure 23 ...................................................................... 14 3/12 rev. a to rev. b added accelerometer data format section ............................... 11 added table 6; renu mbered sequentially .................................. 11 10/07 rev. 0 to rev. a changes to features and general description ............................. 1 added note 6 to table 2 .................................................................. 4 changes to figure 5 .......................................................................... 6 changes to accelerometer control register section ................. 11 changes to layout .......................................................................... 13 changes to layout .......................................................................... 14 deleted figure 24 and table 11 ..................................................... 14 edited second - level assembly section ....................................... 15 updated outline dimensions ....................................................... 16 changes to ordering guide .......................................................... 16 3/06 revision 0: initial version
da ta sheet adis16006 rev. c | page 3 of 16 specifications t a = ?40c to +125c, v cc = 5 v, c x = c y = 0 f, acceleration = 0 g , unless otherwise noted. al l minimum and maximum specifications are guaranteed. typical specifications are not guaranteed. table 1 . parameter conditions min typ max unit accelerometer sensor input each axis measurement range 1 5 g nonlinearity % of full scale 0.5 2.5 % package alignment error 1.5 d egrees alignment error x sensor to y sensor 0.1 d egrees cross - axis sensitivity 1.5 3 % accelerometer sensitivity each axis sensitivity at xfilt, yfilt 242 256 272 lsb/ g sensitivit y change due to temperature 2 delta from 25c 0.3 % zero g bias level each axis 0 g voltage at xfilt, yfilt 1905 2048 2190 lsb 0 g offset vs. temperature 0.1 lsb/c accelerometer noise performance noise density at 25c 200 g /hz rm s accelerometer frequency response 3 , 4 c x , c y range 0 10 f r filt tolerance 24 32 40 k? sensor bandwidth c x = 0 f, c y = 0 f 2.26 khz sensor resonant frequency 5.5 khz accelerometer self - test logic input low 0.2 v cc v logic input high 0.8 v cc v st input resistance to com 30 50 k? output change at x out , y out 5 self - test 0 to self - test 1 102 205 307 lsb temperature sensor accuracy v cc = 3 v to 5.25 v 2 c resolution 10 bits update rate 400 s temperat ure conversion time 25 s digital input input high voltage (v inh ) v cc = 4.75 v to 5.25 v 2.4 v v cc = 3.0 v to 3.6 v 2.1 v input low voltage (v inl ) v cc = 3.0 v to 5.25 v 0.8 v input current v in = 0 v or v cc ?10 + 1 + 10 a input capacitan ce 10 pf digital output output high voltage (v oh ) i source = 200 a, v cc = 3.0 v to 5.25 v v cc ? 0.5 v output low voltage (v ol ) i sink = 200 a 0.4 v
adis16006 data sheet rev. c | page 4 of 16 parameter conditions min typ max unit power supply operating voltage range 3.0 5.25 v quiescent supply cu rrent f sclk = 50 ksps 1.5 1.9 ma power - down current 1.0 ma turn - on time 6 c x , c y = 0.1 f 20 ms 1 guaranteed by measurement of initia l offset and sensitivity. 2 defined as the output change from ambient - to - maximum temperature or ambient - to - minimum temperature. 3 actual bandwidth response controlled by user - supplied external capacitor (c x , c y ). 4 see the setting the bandwidth section for more information on how to reduce the bandwidth. 5 self - test response changes as the square of v cc . 6 larger values of c x and c y increase turn - on time. turn - on time is approximately (160 (0.0022 + c x or c y ) + 4) in milliseconds, where c x and c y are in f. timing specifications t a = ?40c to +125c, acceleration = 0 g , unless otherwise noted. table 2 . parameter 1 , 2 v cc = 3.3 v v c c = 5 v unit description f sclk 3 10 10 khz min 2 2 mhz max t convert 14.5 t sclk 14.5 t sclk t acq 1.5 t sclk 1.5 t sclk throughput time = t convert + t acq = 16 t sclk t 1 10 10 ns min tcs / cs to sclk setu p time t 2 4 60 30 ns max delay from tcs / cs until dout three - state disabled t 3 4 100 75 ns max data access time after sclk falling edge t 4 20 20 ns min data setup time prior to sclk r ising edge t 5 20 20 ns min data hold time after sclk rising edge t 6 0.4 t sclk 0.4 t sclk ns min sclk high pulse width t 7 0.4 t sclk 0.4 t sclk ns min sclk low pulse width t 8 5 80 80 ns max tcs / cs rising edge to dout high impedance t 9 6 5 5 s typ power - up time from shutdown 1 guaranteed by design. all input signals are specified with t r and t f = 5 ns (10% to 90% of v cc ) and timed from a voltage level of 1.6 v. the 3.3 v operating range spans from 3.0 v to 3.6 v. the 5 v operating range spans from 4.75 v to 5.25 v. 2 see figure 3 and figure 4 . 3 mark/s pace ratio for the sclk input is 40/60 to 60/40. 4 measured with the load circuit in figure 2 a nd defined as the time required for the output to cros s 0.4 v or 2.0 v with v cc = 3.3 v and time for an output to cross 0.8 v or 2.4 v with v c c = 5.0 v . 5 t 8 is derived from the measured time taken by the data outputs to change 0.5 v when loaded with the circuit in figure 2 . the measu red number is then extrapolated back to remove the effects of charging or discharging the 50 pf capacitor. this means that the time, t 8 , quoted in the timing specifications is the true bus relinq uish time of the part and is in depe ndent of the bus loading. 6 shutdown recovery time denotes the time it takes to start producing samples and does not account for the recovery time of the sensor, which is dependent on the overall bandwidth .
data sheet adis16006 rev. c | page 5 of 16 circuit and timing diagrams 200a i ol 200a i oh 1.6v to output pin c l 50pf 05975-002 figure 2. load circuit for digita l output timing specifications sclk dout din don?t care zero zero zero add0 one zero pm0 4 leading zeros 1 234 56 15 16 t acq t convert three-state three-state t 1 t 2 t 5 t 4 t 6 t 7 t 3 t 8 db11 db10 db9 db0 cs 0 5975-003 figure 3. accelerometer serial interface timing diagram tcs sclk dout din 1 234 11 15 16 three- state three-state t 1 t 6 t 7 t 3 t 8 db0 db9 db8 leading zero 0 5975-004 figure 4. temperature serial interface timing diagram
adis16006 data sheet rev. c | page 6 of 16 absolute maximum rat ings table 3 . parameter rating acceleration (any axis, unpowered) 3500 g acceleration (any axis, powered) 3500 g v cc ?0.3 v to +7.0 v all other pins (com ? 0.3 v) to (v cc + 0.3 v) output short - circuit duration (any pin to common) indefinite operating temperature range ?40c to +125c storage temperature range ?65c to +150c stresses above those listed under absolu te maximum ratings may cause permanent damage to the device. this is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. exposure t o absolute maximum rating conditions for extended periods may affect device reliability. table 4 . package characteristics package type j a jc device weight 12- terminal lga 200 c/w 25 c/w 0.3 grams 05975-005 1.127 12 3.594 4 6.373 2 3.1865 8 0.500 12 0.670 8 1.797 8 7.2mm 7.2mm s t acked lga. al l dimensions in mm. figure 5 . second - level assembly pad layout esd caution
da ta sheet adis16006 rev. c | page 7 of 16 pin configuration an d function descripti ons adis16006 top view (not to scale) nc com st v cc sclk cs nc = no connect xfilt yfilt nc 9 8 2 7 1 3 6 5 4 10 12 11 tcs dout din 05975-006 figure 6 . pin configuration table 5 . pin function descriptions pin no. mnemonic description 1 tcs temperature chip select. active low logic input. this input frames the serial data transfer for the temperature sensor output. 2 dout data out, logic output. the conversion of the adis16006 is provided on this output as a serial data stream. the bits are clocked out on the falling edge of the sclk input. 3 din data in, logic input. data to be written into the control register of the adis16006 is provided on this input and is clocked into the register on the rising edge of sclk. 4 com common. reference point for all circuitry on the adis16006 . 5, 7 nc no connect. 6 st self - test input. active high logic input. simulates a nominal 0.75 g test input for diagnostic purpose. 8 yf i lt y - channel filter node. used in conjunction with an opti onal ext ernal capacitor to band limit the noise contribution from the accelerometer. 9 x f i lt x - channel filter node. used in conjunction with an opti ona l external capacitor to band limit the noise contribution from the accelerometer. 10 cs chip select. active low logic input. this input provides the dual function of initiating the accelerometer conversions on the adis16006 and framing the serial data transfer for the accelerometer output. 11 v cc power supply input. the v cc range for the adis16006 is 3.0 v to 5.25 v. 12 sclk serial clock, logic input. sclk provides the serial clock for accessing data from the part and writing serial data to the control register. this clock input is also used as the clock source for the conversion process of the adis16006 .
adis16006 data sheet rev. c | page 8 of 16 typical performance characteristics 262 254 255 256 257 258 259 260 261 ?50 ?25 0 25 50 75 100 125 150 sensitivity (lsb/ g ) temperature (c) b1-x b1-y b2-x b2-y b3-x b3-y b4-x b4-y b5-x b5-y 05975-007 figure 7. sensitivity vs. temperature (1 g stimulus) 2048 2046 2044 2042 2040 2038 ?40 ?20 0 20 40 60 80 100 120 bias level (lsb) temperature (c) avg at 3.00v avg at 3.30v avg at 3.60v avg at 4.75v avg at 5.25v 5.25v 05975-008 figure 8. x-axis 0 g bias vs. temperature 2048 2046 2044 2042 2040 2038 2047 2045 2043 2041 2039 3.0 5.5 5.0 4.5 4.0 3.5 bias level (lsb) v cc (v) ?40c +25c +125c 05975-009 figure 9. x-axis 0 g bias vs. supply voltage 25 20 15 10 5 0 1995 2000 2005 2010 2015 2020 2025 2030 2035 2040 2045 2050 2055 2060 2065 2070 2075 2080 2085 2090 percent of population (%) output (lsb) average = 2040.66 standard deviation = 23.19 05975-010 figure 10. x-axis 0 g bias at 25c 40 35 30 25 20 15 10 5 0 1995 2000 2005 2010 2015 2020 2025 2030 2035 2040 2045 2050 2055 2060 2065 2070 2075 2080 2085 2090 percent of population (%) output (lsb) average = 2055.875 standard deviation = 6.464 05975-011 figure 11. y-axis 0 g bias at 25c 60 50 40 30 20 10 0 percent of population (%) noise ( g / hz) 80 85 90 95 100 105 110 115 120 125 130 135 140 05975-012 figure 12. noise (x-axis) at v cc = 5 v, 25c
data sheet adis16006 rev. c | page 9 of 16 45 40 35 30 25 20 15 10 5 0 percent of population (%) noise ( g / hz) 80 85 90 95 100 105 110 115 120 125 130 135 140 05975-013 figure 13. noise (y-axis) at v cc = 5 v, 25c 40 35 30 25 20 15 10 5 0 percent of population (%) output (lsb) 110 130 150 170 190 210 230 250 270 290 average = 202.2137 standard deviation = 12.09035 05975-014 figure 14. x-axis self-test at v cc = 5 v, 25c 40 35 30 25 20 15 10 5 0 percent of population (%) output (lsb) 110105 10095 9085807570656055 50 4540 average = 82.89281 standard deviation = 4.908012 05975-015 figure 15. x-axis self-test at v cc = 3.3 v, 25c 250 200 150 100 50 0 self test (lsb) temperature (c) 150 50 100 0 ?50 avg at 3.00v avg at 3.30v avg at 3.60v avg at 4.75v avg at 5.00v avg at 5.25v 05975-016 figure 16. self-test x-axis vs. temperature 250 230 210 190 170 150 130 110 90 70 50 self test (lsb) v cc (v) 5.5 +125c +25c ?40c 4.0 4.5 5.0 3.5 3.0 05975-017 figure 17. self-test x-axis vs. supply voltage +125c +25c ?40c 1.8 1.7 1.6 1.5 1.4 1.3 1.2 1.1 1.0 supply current (ma) v cc (v) 5.5 4.0 4.5 5.0 3.5 3.0 05975-018 figure 18. supply current vs. supply voltage
adis16006 data sheet rev. c | page 10 of 16 45 35 25 15 5 ?5 percent of population (%) current (ma) 05975-023 v cc = 5.0v v cc = 3.3v 1.59 1.15 1.19 1.23 1.27 1.31 1.35 1.39 1.43 1.47 1.51 1.55 figure 19. supply current at 25c 60 50 40 30 20 10 0 percent of population (%) current (ma) 1.10 0.70 0.74 0.78 0.82 0.86 0.90 0.94 0.98 1.02 1.06 05975-019 v cc = 5.0v v cc = 3.3v figure 20. power-down supply current 1.3 1.2 1.1 1.0 0.9 0.8 0.7 0.6 power-down supply current (ma) v cc (v) 5.5 5.0 4.5 4.0 3.5 3.0 05975-020 +125c +25c ?40c figure 21. power-down supply current vs. supply voltage sampling error (db) sample rate (ksps) 05975-024 100 110 0.6 ?1.0 ?0.8 ?0.6 ?0.4 ?0.2 0 0.2 0.4 figure 22. sampling error vs. sampling frequency
da ta sheet adis16006 rev. c | page 11 of 16 t heory of operation the adis16006 is a low cost, low power, complete dual - axis acceleromete r with an integrated serial peripheral interface (spi) and an integrated temperature sensor whose output is also available on the spi interface. the adis16006 is capable of measuring acceleration with a full - scale range of 5 g (minimum). the adis16006 can measure both dynamic acceleration (vibration) and static acceleration (gravity). accelerometer data f ormat the accelerometer data is in a 12 - bit, offset bina ry format. see table 6 for examples of this data format. table 6 . acceleration data format examples acceleration ( g ) decimal hex binary +5 3328 0xd00 1101 0000 0000 +2/256 2050 0x802 1000 0000 001 0 +1/ 256 2049 0x801 1000 0000 0001 0 2048 0x800 1000 0000 0000 ?1/256 2047 0x7ff 0111 1111 1111 ?2/256 2046 0x7fe 0111 1111 1110 ?5 768 0x300 0011 0000 0000 self - test the st pin controls the self - test feature. when this pin is set to v cc , an electrostati c force is exerted on the beam of the acceler - ometer. the resulting movement of the beam allows the user to test if the accelerometer is functional. the typical change in output is 801 m g (corresponding to 205 lsb) for v cc = 5.0 v. this pin can be left ope n - circuit or connected to common in normal use. the st pin should never be exposed to voltage greater than v cc + 0.3 v. if the system design is such that this condition cannot be guaranteed ( for example , multiple supply voltages are present), a low v f clam ping diode between st and v cc is recommended. serial interface the serial interface on the adis16006 consists of five wires: cs , tcs , sclk, din, and dout. both ac celerometer axes and the temperature sensor data are available on the serial interface. the cs and tcs are used to select the accelerometer or tem - perature sensor outputs, respectively. cs and tcs cannot be active at the same time. the sclk input access es data from the internal data registers. accelerometer serial interface figure 3 shows the detailed timing diagram for serial interfacing to the accelerometer in the adis16006 . the serial clock provides the conversion clock. cs initiates the conversion process and data transfer and frames the serial data transfer for the accelerometer output. the accelerometer output is sampled on the second rising edge of the sclk input after the falling edge of cs . the conversion requires 16 sclk cycles to complete. the rising edge of cs puts the bus back into three - state. if cs remains low, the next digital conversion is initiated. the details for the control register bit functions are shown in table 7 . accelerometer control register msb lsb dontc zero zero zero add0 one zero pm0 table 7 . accelerometer control register bit functions bit mnemonic comments 7 dontc dont care. can be 1 or 0. 6, 5, 4 zero these bits should be held low. 3 add0 this address bit se lects the x - axis or y - axis outputs. a 0 selects the x - axis; a 1 selects the y - axis. 2 one this bit should be held high. 1 zero this bit should be held low. 0 pm0 this bit selects the operation mode for the accelerometer; set to 0 for normal operation an d 1 for power - down mode. power - down by setting pm0 to 1 when updating the accelerometer control register, the adis16006 goes into shutdown mode. the information stored in the control register is maintained during shutdown. the adis16006 changes modes as soon as the contro l register is updated. i f the part is in shutdown mode and pm0 is changed to 0, the part powers up on the 16th sclk rising edge. add0 by sett ing add0 to 0 when updating the accelerometer control register, the x - axis output is selected. by setting add0 to 1, the y - axis output is selected. zero zero is defined as the l ogic low level. one one is defined as the l ogic high level. dontc dontc is defi ned as dont care and can be a low or high logic level. accelerometer conversion details every time the accelerometer is sampled, the sampling function discharges the internal c x or c y filtering capacitors by up to 2% of their initial values (assuming no additional external filtering capacitors are added). the recovery time for the filter capacitor to recharge is approximately 10 s. th erefore , sampling the accelerometer at a rate of 10 ksps or less does not induce a sampling error. however, as sampling fr equencies increase above 10 ksps, one can expect sampling errors to attenuate the actual acceleration levels.
adis16006 data sheet rev. c | page 12 of 16 temperature sensor s erial interface read operation figure 4 shows the timing diagram for a serial read from the tempe rature sensor. the tcs line enables the sclk input. ten bits of data and a leading zero are transferred during a read operation. read operations occur during streams of 16 clock pulses. the serial data can be received into two bytes to accommodate the entire 10 - bit data stream. if only eight bits of resolution are required, the data can be received into a single byte. at the end of the read operation, the dout line remains in the state of the last bit of data clocked out until tcs goes high, at which time the dout line from the temperature sensor goes three - state. write operation figure 4 also shows the timing diagram for the serial write to the temperature sensor. the write operatio n takes place at the same time as the read operation. data is clocked into the control register on the rising edge of sclk. din should remain low for the entire cycle. temperature sensor control register msb lsb zero zero zero zero zero zero zero z ero table 8 . temperature sensor control register bit functions bit mnemonic comments 7 to 0 zero all bits should be held low. zero zero is defined as the l ogic low level. output data f ormat the output data format for the temper ature sensor is twos complement. table 9 shows the relationship between the temperature and the digital output . table 9 . temperature sensor data format temperature digital output (db9 db0) ? 40c 11 0110 0000 ? 25c 11 1001 1100 ? 0.25c 11 1111 1111 0c 00 0000 0000 +0.25c 00 0000 0001 +10c 00 0010 1000 +25c 00 0110 0100 +50c 00 1100 1000 +75c 01 0010 1100 +100c 01 1001 0000 +125c 01 1111 0100 temperature sensor conversion details the adis16006 features a 10 - bit digital temperature sensor that allows an accurate measurement of the ambient device temperature to be made . the conversion clock for the temperature sensor is internal ly generated ; therefore, no external clock is required except when reading from and writing to the serial port. in normal mode, an internal clock oscillator runs the automatic conversion sequence. a con version is initiated approximately every 350 s. at th is time, the temperature sensor wakes up and performs a temperature conversion. this temperature conversion typically takes 25 s, at which time the temperature sensor automatically shuts down. the result of the most recent temperature conversion is avail - able in the serial output register at any time. once the conversion is finished, an internal oscillator starts counting and is designed to time out every 35 0 s . the temperature sensor then powers up and does a conversion. i f the tcs is brought low every 350 s (30%) or less, the same temperature value is output onto the dout line every time without changing. it is recommended that the tcs line not be brought low every 350 s (30%) or less. the 30% covers p rocess variation. the tcs should become active (high to low) outside this range. the device is designed to autoconvert every 350 s. if the temperature sensor is accessed during the conversion process, an internal signal is generated to prevent any update of the temperature value register during the conversion. this prevents the user from reading back spurious data. the design of this feature results in this internal lockout signal being reset only at the start of the next autoconvers ion. therefore, if the tcs line goes active before the internal lockout signal is reset to its inactive mode, the internal lockout signal is not reset. to ensure that no lockout signal is set, bring tcs low at a greater time than 350 s (30%). as a result, the temperature sensor is not interrupted during a conversion process. in the automatic conversion mode, every time a read or write operation takes place, the internal clock oscillator is restarted at the en d of the read or write operation. the result of the conversion is typically available 25 s later. reading from the device before conversion is complete provides the same set of data. power supply decoupl ing the adis16006 integrates two decoupling capacitors that are 0.047 f in value. for local operation of the adis16006 , no additional power supply decoupling capacitance is required. however, if the system power supply presents a substantial amount of noise, additional filtering can be required. if additional capacitors are required, connect the ground terminal of each of these capacitors directly to the underlying ground plane. finally, note that all analog and digital grounds should be refer enced to the same system ground reference point.
da ta sheet adis16006 rev. c | page 13 of 16 setting the bandwidt h the adis16006 has provisions for band limit ing the acceler - ometer. capacitors can be added at the xfilt pin and the yfilt pin to implement further low - pass filtering for antialiasing and noise reduction. the equation for the 3 db bandwidth is f ?3db = 1/(2(32 k?) ( c (xfilt, yfilt) + 2200 pf)) or more simply, f ?3db = 5 f/( c (xfilt, yfilt) + 2200 pf) the tolerance of the internal resistor (r filt ) can vary typically as much as 25% of its nominal value (32 k?); thus, the bandwidth varies accordin gly. a minimum capacitance of 0 pf for c xfilt and c yfilt is allowable. table 10 . filter capacitor selection, c xfilt and c yfilt bandwidth (hz) capacitor (f) 1 4.7 10 0.47 50 0.10 100 0.047 200 0.022 400 0.01 2250 0 selecting filter cha racteristics: the noise/ bandwidth trade - off the accelerometer bandwidth selected ultimately determines the measurement resolution (smallest detectable acceleration). filtering can be used to lower the noise floor, which improves the resolution of the accelerometer. resolution is dependent on the analog filter bandwidth at xfilt and yfilt. the adis16006 has a typical bandwidth of 2.25 khz with no external filtering. the analog bandwidth can be further decreased to reduce noise and improve resolution. the adis16006 noise has the characteristics of white gaussian noise, which contributes equally at all frequencies and is described in terms o f g /hz (that is, the noise is proportional to the square root of the bandwidth of the accelerometer ). the user should limit bandwidth to the lowest frequency needed by the application to maximize the resolution and dynamic range of the accelerometer. wi th the s ingle - pole , roll - off characteristic, the typical noise of the adis16006 is determined by rmsnoise = (200 g / hz) ( ( bw 1.57)) at 100 hz, the noise is rmsnoise = (200 g / hz) ( (100 1.57)) = 2.5 m g often, the peak value of the noise is desired. peak - to - peak noise can only be estimated by statistical methods. table 11 is useful for estimating the probabilities of exceeding various peak values, given the rms value. tab le 11 . estimation of peak -to - peak noise peak - to - peak value percentage of time noise exceeds nominal peak - to - peak value (%) 2 rms 32 4 rms 4.6 6 rms 0.27 8 rms 0.006
adis16006 data sheet rev. c | page 14 of 16 12 4 10 11 a y a x 6 5 8 9 7 3 2 1 12 4 10 11 6 5 8 9 7 3 2 1 12 4 10 11 6 5 8 9 7 3 2 1 12 4 10 11 6 5 8 9 7 3 2 1 top view not to scale digital output (in lsbs) x-axis: 1792 y-axis: 2048 digital output (in lsbs) x-axis: 2304 y-axis: 2048 digital output (in lsbs) x-axis: 2048 y-axis: 2304 digital output (in lsbs) x-axis: 2048 y-axis: 1792 digital output (in lsbs) x-axis: 2048 y-axis: 2048 05975-021 a y a x a y a x a y a x figure 23 . output response vs. orientation
da ta sheet adis16006 rev. c | page 15 of 16 applications second level assembly the adis16006 can be attached to the second level assembly board using sn63 (or equivalent) or lead - free solder. ipc/ jedec j - std - 020 and j - std - 033 provide standard handling procedures for these types of packages.
adis16006 data sheet rev. c | page 16 of 16 outline dimensions 092407-c side view top view bottom view pin 1 indicator 3.70 max 7.20 typ 1 3 4 6 7 9 10 12 7.35 max 3.594 bsc (4 ) 1.797 bsc (8 ) 5.00 typ 6 .373 bsc (2 ) 0.200 min (all sides ) 0.373 bsc (12 ) 1.00 bsc (12 ) 0.797 bsc (8 ) figure 24. 12-terminal land grid array [lga] (cc-12-1) dimensions shown in millimeters ordering guide model 1 temperature range package description package option adis16006cccz ?40c to +125c 12-terminal land grid array (lga) cc-12-1 adis16006/pcbz evaluation board 1 z = rohs compliant part. ?2006C2013 analog devices, inc. all rights reserved. trademarks and registered trademarks are the prop erty of their respective owners. d05975-0-2/13(c)

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